13

Preface

Year:
1997
Language:
english
File:
PDF, 40 KB
english, 1997
14

Klassifikation der rastersondenmikroskopischen Verfahren

Year:
2003
Language:
german
File:
PDF, 247 KB
german, 2003
21

Roughness and deposition mechanism of DLC films prepared by r.f. plasma glow discharge

Year:
1998
Language:
english
File:
PDF, 437 KB
english, 1998
25

Preface

Year:
2003
Language:
english
File:
PDF, 42 KB
english, 2003
30

Quantitative analysis of silicon-oxynitride films by EPMA

Year:
1999
Language:
english
File:
PDF, 771 KB
english, 1999
32

Preface

Year:
1997
Language:
english
File:
PDF, 83 KB
english, 1997
34

12th Conference on Solid State Analysis

Year:
2004
Language:
english
File:
PDF, 135 KB
english, 2004
35

14th Conference on Solid State Analysis

Year:
2008
Language:
english
File:
PDF, 54 KB
english, 2008
42

16th Conference on Solid State Analysis

Year:
2012
Language:
english
File:
PDF, 66 KB
english, 2012